Publication:
Gate-dielectric interface effects in low frequency (1/f) noise in p-MOSFETs with high-K dielectrics
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1950 since deposited on 2021-10-16
1last month
Acq. date: 2025-12-08
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Metrics
Views
1950 since deposited on 2021-10-16
1last month
Acq. date: 2025-12-08
Citations