Skip to content
Institutional repository
Communities & Collections
Browse
Site
Log In
imec Publications
Conference contributions
Gate-dielectric interface effects in low frequency (1/f) noise in p-MOSFETs with high-K dielectrics
Publication:
Gate-dielectric interface effects in low frequency (1/f) noise in p-MOSFETs with high-K dielectrics
Date
2005
Proceedings Paper
Simple item page
Full metadata
Statistics
Loading...
Loading...
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Srinivasan, Purushothaman
;
Simoen, Eddy
;
Singanamalla, Raghunath
;
Yu, HongYu
;
Claeys, Cor
;
Misra, D.
Journal
Abstract
Description
Metrics
Views
1947
since deposited on 2021-10-16
Acq. date: 2025-10-23
Citations
Metrics
Views
1947
since deposited on 2021-10-16
Acq. date: 2025-10-23
Citations