Publication:
Gate-dielectric interface effects in low frequency (1/f) noise in p-MOSFETs with high-K dielectrics
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1957 since deposited on 2021-10-16
6last month
3last week
Acq. date: 2026-03-16
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Statistics
Views
1957 since deposited on 2021-10-16
6last month
3last week
Acq. date: 2026-03-16
Citations