Publication:
Gate-dielectric interface effects in low frequency (1/f) noise in p-MOSFETs with high-K dielectrics
Date
| dc.contributor.author | Srinivasan, Purushothaman | |
| dc.contributor.author | Simoen, Eddy | |
| dc.contributor.author | Singanamalla, Raghunath | |
| dc.contributor.author | Yu, HongYu | |
| dc.contributor.author | Claeys, Cor | |
| dc.contributor.author | Misra, D. | |
| dc.contributor.imecauthor | Simoen, Eddy | |
| dc.contributor.orcidimec | Simoen, Eddy::0000-0002-5218-4046 | |
| dc.date.accessioned | 2021-10-16T05:23:35Z | |
| dc.date.available | 2021-10-16T05:23:35Z | |
| dc.date.issued | 2005 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/11265 | |
| dc.source.conference | International Semiconductor Device Research Symposium - ISDRS | |
| dc.source.conferencedate | 7/12/2005 | |
| dc.source.conferencelocation | Bethesda, MD USA | |
| dc.title | Gate-dielectric interface effects in low frequency (1/f) noise in p-MOSFETs with high-K dielectrics | |
| dc.type | Proceedings paper | |
| dspace.entity.type | Publication | |
| Files | ||
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