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Modeling and experimental verification of substrate noise generation in a 220-Kgates WLAN system-on-chip with multiple supplies
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Modeling and experimental verification of substrate noise generation in a 220-Kgates WLAN system-on-chip with multiple supplies
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Date
2003
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Badaroglu, Mustafa
;
Donnay, Stephane
;
De Man, Hugo
;
Zinzius, Yann
;
Gielen, Georges
;
Sansen, Willy
;
Fonden, Tony
;
Signell, Svante
Journal
IEEE Journal of Solid-State Circuits
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Views
1847
since deposited on 2021-10-15
1
last month
Acq. date: 2026-02-25
Citations