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Modeling and experimental verification of substrate noise generation in a 220-Kgates WLAN system-on-chip with multiple supplies

Date

2003
Journal article
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dc.contributor.authorBadaroglu, Mustafa
dc.contributor.authorDonnay, Stephane
dc.contributor.authorDe Man, Hugo
dc.contributor.authorZinzius, Yann
dc.contributor.authorGielen, Georges
dc.contributor.authorSansen, Willy
dc.contributor.authorFonden, Tony
dc.contributor.authorSignell, Svante
dc.contributor.imecauthorBadaroglu, Mustafa
dc.contributor.imecauthorDonnay, Stephane
dc.contributor.imecauthorDe Man, Hugo
dc.contributor.imecauthorGielen, Georges
dc.contributor.orcidimecDonnay, Stephane::0000-0003-2489-4793
dc.date.accessioned2021-10-15T03:59:29Z
dc.date.available2021-10-15T03:59:29Z
dc.date.issued2003
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/7163
dc.source.beginpage1250
dc.source.endpage1260
dc.source.issue7
dc.source.journalIEEE Journal of Solid-State Circuits
dc.source.volume38
dc.title

Modeling and experimental verification of substrate noise generation in a 220-Kgates WLAN system-on-chip with multiple supplies

dc.typeJournal article
dspace.entity.typePublication
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