Publication:
Reliable gate-voltage-dependent channel-length and series resistance extraction technique taking into account threshold voltage reduction in MOSFETs
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1894 since deposited on 2021-09-29
2last week
Acq. date: 2025-11-01
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Metrics
Views
1894 since deposited on 2021-09-29
2last week
Acq. date: 2025-11-01
Citations