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Applicability of non-linear modelling methods based on vectorial large-signal measurements to MOSFETs
Publication:
Applicability of non-linear modelling methods based on vectorial large-signal measurements to MOSFETs
Date
2000
Proceedings Paper
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Schreurs, Dominique
;
Vandamme, Ewout
;
Vandenberghe, S.
;
Carchon, Geert
;
Nauwelaers, Bart
Journal
Abstract
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Metrics
Views
1912
since deposited on 2021-10-14
418
item.page.metrics.field.last-week
Acq. date: 2025-10-24
Citations