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Applicability of non-linear modelling methods based on vectorial large-signal measurements to MOSFETs

Date

2000
Proceedings Paper
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dc.contributor.authorSchreurs, Dominique
dc.contributor.authorVandamme, Ewout
dc.contributor.authorVandenberghe, S.
dc.contributor.authorCarchon, Geert
dc.contributor.authorNauwelaers, Bart
dc.contributor.imecauthorSchreurs, Dominique
dc.contributor.imecauthorNauwelaers, Bart
dc.date.accessioned2021-10-14T13:44:54Z
dc.date.available2021-10-14T13:44:54Z
dc.date.embargo9999-12-31
dc.date.issued2000
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/4733
dc.source.beginpage457
dc.source.conferenceIEEE MTT-S International Microwave Symposium
dc.source.conferencedate11/06/2000
dc.source.conferencelocationBoston, MA USA
dc.source.endpage460
dc.title

Applicability of non-linear modelling methods based on vectorial large-signal measurements to MOSFETs

dc.typeProceedings paper
dspace.entity.typePublication
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