Analysis of the features of hot-carrier degradation in FinFETs

Simple item page Full metadata Statistics

Files

40694.pdf 1007.05 KB

Author(s)

Makarov, Alexander

;

Tyaginov, Stanislav

;

;

;

Vaisman Chasin, Adrian

;

Grill, Alexander

;

Hellings, Geert

;

Vexler, Mikhail

;

Linten, Dimitri

;

Journal

Semiconductors

Metrics

1918 since deposited on 2021-10-25

Acq. date: 2025-10-24