Publication:

Analysis of the features of hot-carrier degradation in FinFETs

Date

2018-10

Journal article

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Files

40694.pdf 1007.05 KB

Author(s)

Makarov, Alexander

;

Tyaginov, Stanislav

;

;

;

Vaisman Chasin, Adrian

;

Grill, Alexander

;

Hellings, Geert

;

Vexler, Mikhail

;

Linten, Dimitri

;

Journal

Semiconductors

Statistics

1920 since deposited on 2021-10-25

Acq. date: 2026-02-25