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Unsupervised Machine Learning based CD-SEM image segregator for OPC and Process Window Estimation
Publication:
Unsupervised Machine Learning based CD-SEM image segregator for OPC and Process Window Estimation
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Date
2020
Proceedings Paper
https://doi.org/10.1117/12.2552055
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Dey, Bappaditya
;
Cerbu, Dorin
;
Khalil, Kasem
;
Halder, Sandip
;
Leray, Philippe
;
Das, Sayantan
;
Sherazi, Yasser
;
Bayoumi, Magdy A.
;
Kim, Ryan Ryoung han
Journal
NA
Abstract
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1890
since deposited on 2021-11-02
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Downloads
166
since deposited on 2021-11-02
31
last month
7
last week
Acq. date: 2025-12-12
Views
1890
since deposited on 2021-11-02
2
last month
Acq. date: 2025-12-12
Citations