Publication:

A study of gate oxide damage due to the plasma etching process on sub-0.25μm technology

Date

Loading...
Thumbnail Image

Author(s)

Journal

Abstract

Description

Metrics

Views

2017 since deposited on 2021-10-14
416item.page.metrics.field.last-week
Acq. date: 2025-10-25

Citations

Metrics

Views

2017 since deposited on 2021-10-14
416item.page.metrics.field.last-week
Acq. date: 2025-10-25

Citations