Publication:
Statistical characterization of off-state stress degradation in planar HKMG nFETs using device arrays
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433 since deposited on 2024-08-16
3last month
Acq. date: 2026-08-14
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Statistics
Views
433 since deposited on 2024-08-16
3last month
Acq. date: 2026-08-14
Citations