Publication:
Statistical characterization of off-state stress degradation in planar HKMG nFETs using device arrays
| dc.contributor.author | Saraza Canflanca, Pablo | |
| dc.contributor.author | Sangani, Dishant | |
| dc.contributor.author | Diaz Fortuny, Javier | |
| dc.contributor.author | Tyaginov, Stanislav | |
| dc.contributor.author | Gielen, Georges | |
| dc.contributor.author | Bury, Erik | |
| dc.contributor.author | Kaczer, Ben | |
| dc.contributor.imecauthor | Saraza-Canflanca, P. | |
| dc.contributor.imecauthor | Sangani, D. | |
| dc.contributor.imecauthor | Diaz-Fortuny, J. | |
| dc.contributor.imecauthor | Tyaginov, S. | |
| dc.contributor.imecauthor | Gielen, G. | |
| dc.contributor.imecauthor | Bury, E. | |
| dc.contributor.imecauthor | Kaczer, B. | |
| dc.date.accessioned | 2024-08-16T18:29:16Z | |
| dc.date.available | 2024-08-16T18:29:16Z | |
| dc.date.issued | 2024 | |
| dc.description.wosFundingText | This work was supported in part by the Cybersecurity Research Flanders with reference number VR20192203. | |
| dc.identifier.doi | 10.1109/IRPS48228.2024.10529367 | |
| dc.identifier.eisbn | 979-8-3503-6976-2 | |
| dc.identifier.isbn | 979-8-3503-6977-9 | |
| dc.identifier.issn | 1541-7026 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/44334 | |
| dc.publisher | IEEE | |
| dc.source.conference | International Reliability Physics Symposium (IRPS) | |
| dc.source.conferencedate | 2024-04-14 | |
| dc.source.conferencelocation | Grapevine | |
| dc.source.numberofpages | 9 | |
| dc.title | Statistical characterization of off-state stress degradation in planar HKMG nFETs using device arrays | |
| dc.type | Proceedings paper | |
| dspace.entity.type | Publication | |
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