Publication:

Electrical characterisation and reliability studies of thick film gas sensor structures

Date

1996
Proceedings Paper
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dc.contributor.authorCzech, Ingrid
dc.contributor.authorManca, Jean
dc.contributor.authorRoggen, Jean
dc.contributor.authorHuyberechts, Guido
dc.contributor.authorStals, Lambert
dc.contributor.authorDe Schepper, Luc
dc.date.accessioned2021-09-29T14:20:41Z
dc.date.available2021-09-29T14:20:41Z
dc.date.embargo9999-12-31
dc.date.issued1996
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/1141
dc.source.beginpage99
dc.source.conferenceIEEE International Conference on Microelectronic Test Structures - ICMTS
dc.source.conferencedate26/03/1996
dc.source.conferencelocationTrento Italy
dc.source.endpage103
dc.title

Electrical characterisation and reliability studies of thick film gas sensor structures

dc.typeProceedings paper
dspace.entity.typePublication
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