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Charge trapping in metal-ferroelectric-insulator-semiconductor structure with SrBi2Ta2O9/Al2O3/SiO2 stack
Publication:
Charge trapping in metal-ferroelectric-insulator-semiconductor structure with SrBi2Ta2O9/Al2O3/SiO2 stack
Date
2004-08
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Xu, Zhen
;
Kaczer, Ben
;
Johnson, Jo
;
Wouters, Dirk
;
Groeseneken, Guido
Journal
Journal of Applied Physics
Abstract
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1901
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Acq. date: 2025-12-08
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Views
1901
since deposited on 2021-10-15
1
last month
1
last week
Acq. date: 2025-12-08
Citations