Publication:

How to use DUV BARCs on topography

Date

 
dc.contributor.authorOp de Beeck, Maaike
dc.contributor.authorVandenberghe, Geert
dc.contributor.authorJaenen, Patrick
dc.contributor.authorZhang, Fenghong
dc.contributor.authorDelvaux, Christie
dc.contributor.authorVan Puyenbroeck, Ilse
dc.contributor.authorRonse, Kurt
dc.contributor.imecauthorOp de Beeck, Maaike
dc.contributor.imecauthorVandenberghe, Geert
dc.contributor.imecauthorJaenen, Patrick
dc.contributor.imecauthorDelvaux, Christie
dc.contributor.imecauthorRonse, Kurt
dc.contributor.orcidimecOp de Beeck, Maaike::0000-0002-2700-6432
dc.date.accessioned2021-10-01T08:37:55Z
dc.date.available2021-10-01T08:37:55Z
dc.date.issued1998
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/2841
dc.source.beginpage13
dc.source.issueSummer Issue
dc.source.journalMicrolithography World
dc.title

How to use DUV BARCs on topography

dc.typeJournal article
dspace.entity.typePublication
Files
Publication available in collections: