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Relationships between deposition parameters, step coverage, throughput, and electrical properties of PEALD SiO2 insulation liners for HVM TSV application
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Relationships between deposition parameters, step coverage, throughput, and electrical properties of PEALD SiO2 insulation liners for HVM TSV application
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Date
2011
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Jung, In Soo
;
Woo, Jeong-Jun
;
Kwon, Hak Yong
;
Kim, Young-Jae
;
Kang, Dong-Suk
;
Park, Ju-Hyuk
;
Ahn, Dae-Young
;
Choi, Seung-Woo
;
Park, Hyung-Sang
;
Yoo, Yong Min
;
Civale, Yann
;
Redolfi, Augusto
;
Thangaraju, Sarasvathi
;
Travaly, Youssef
;
Swinnen, Bart
;
Beyne, Eric
;
De Roest, David
;
Beynet, Julien
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2049
since deposited on 2021-10-19
1
last month
1
last week
Acq. date: 2025-12-12
Citations