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TEASE: A systematic analysis framework for early evaluation of FinFET-based advanced technology nodes
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TEASE: A systematic analysis framework for early evaluation of FinFET-based advanced technology nodes
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Date
2013
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Mallik, Arindam
;
Zuber, Paul
;
Liu, Tsung-Te
;
Chava, Bharani
;
Ballal, Bhavana
;
Royer Del Barrio, Pablo
;
Baert, Rogier
;
Croes, Kris
;
Ryckaert, Julien
;
Badaroglu, Mustafa
;
Mercha, Abdelkarim
;
Verkest, Diederik
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1996
since deposited on 2021-10-21
Acq. date: 2025-12-10
Citations
Metrics
Views
1996
since deposited on 2021-10-21
Acq. date: 2025-12-10
Citations