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Conference contributions
Non-destructive in-line IMC thickness measurement using acoustic metrology
Publication:
Non-destructive in-line IMC thickness measurement using acoustic metrology
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Date
2019
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Mukundhan, Priya
;
Hou, Lin
;
Derakhshandeh, Jaber
;
Liebens, Maarten
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1960
since deposited on 2021-10-27
Acq. date: 2025-12-15
Citations
Metrics
Views
1960
since deposited on 2021-10-27
Acq. date: 2025-12-15
Citations