Publication:
Model for the current-voltage characteristics of ultrathin gate oxides after soft breakdown
Date
Loading...
Files
Journal
Abstract
Description
Metrics
Views
1905 since deposited on 2021-09-30
Acq. date: 2025-12-15
Citations
Metrics
Views
1905 since deposited on 2021-09-30
Acq. date: 2025-12-15
Citations