Browsing imec Publications by title

Fundamental Principles of Phase Shifting Masks by Fourier Optics: Theory and Experimental Verification

Ronse, Kurt; Op de Beeck, Maaike; Van den hove, Luc; Engelen, J. (1994)

Fundamental relation between local and effective transverse-field-dependent mobility for electrons in inversion channels

Biesemans, Serge; De Meyer, Kristin (1996)

Fundamental study of atomic layer deposition in and on porous low-k films

Verdonck, Patrick; Delabie, Annelies; Swerts, Johan; Farrell, L; Baklanov, Mikhaïl; Tielens, Hilde; Van Besien, Els; Witters, J.; Nyns, Laura; Van Elshocht, Sven (2011)

Fundamental study of IMC grains at low anneal temperature

Gerets, Carine; Derakhshandeh, Jaber; Shafahian, Ehsan; Cochet, Tom; La Tulipe, Douglas Charles; Beyer, Gerald; Miller, Andy; Beyne, Eric (2022)

Fundamental study of ion-substrate interactions with low energy reactive ions

De Witte, Hilde (2001-03)

Fundamental study of laser interactions with periodic arrays of nanoscale Si fin structures

Gawlik, Andrzej; Bogdanowicz, Janusz; Schulze, Andreas; Misiewicz, Jan; Vandervorst, Wilfried (2017)

Fundamental study of photomodulated optical reflectance towards non-destructive carrier profiling in silicon

Bogdanowicz, Janusz (2011-05)

Fundamental study of the apparent voltage-dependence of NBTI kinetics by constant electric field stress in Si and SiGe devices

Mukhopadhyay, Subhadeep; Franco, Jacopo; Vaisman Chasin, Adrian; Roussel, Philippe; Kaczer, Ben; Groeseneken, Guido; Horiguchi, Naoto; Linten, Dimitri; Thean, Aaron (2016)

Fundamental study of the removal mechanisms of nano-sized particles using brush scrubber cleaning

Xu, Kaidong; Vos, Rita; Vereecke, Guy; Doumen, Geert; Fyen, Wim; Mertens, Paul; Heyns, Marc; Vinckier, Chris; Fransaer, J.; Kovacs, F. (2005)

Fundamental study on non-invasive frequency injection attack against RO-based TRNG

Osuka, Saki; Fujimoto, Daisuke; Hayashi, Yu-ichi; Homma, Naofumi; Beckers, Arthur; Balasch, Joseph; Gierlichs, Benedikt; Verbauwhede, Ingrid (2018)

Fundamental study on the impact of C Co-implantation on ultra shallow B junctions

Zschaetzsch, Gerd; Vandervorst, Wilfried; Hoffmann, Thomas Y.; Everaert, Jean-Luc; del Agua Borniquel, Jose Ignacio (2009)

Fundamental suppression of backscattering in silicon microrings

Li, Ang; Bogaerts, Wim (2017-02)

Fundamental thermodynamic noise integrated photonic sensors

Le Thomas, Nicolas (2018)

Fundamental understanding and experimental verification of bright versus dark field imaging

Davydova, Natalia; Finders, Jo; van Lare, Claire; McNamara, John; Van Setten, Eelco; Zekry, Joseph; Fliervoet, Timon; Carpaij, Rene; Franke, Joern-Holger; Frommhold, Andreas; Verch, Andreas; Kersteen, Grizelda; Capelli, Renzo (2020)

Fundamentally cancel backscattering in silicon microrings

Li, Ang; Bogaerts, Wim (2017)

Fundamentals and applications of CVD diamond

Haenen, Ken; Nesladek, Milos (2011)

Fundamentals and applications of diamond and nanocarbons

Haenen, Ken; Nesladek, Milos (2013)

Fundamentals and extraction of velocity saturation in sub-100nm (110)-Si and (100)-Ge

Pantisano, Luigi; Trojman, Lionel; Mitard, Jerome; De Jaeger, Brice; Severi, Simone; Eneman, Geert; Crupi, G.; Hoffmann, Thomas Y.; Ferain, Isabelle; Meuris, Marc; Heyns, Marc (2008)

Fundamentals of Ge1-xSnx and SiyGe1-x-ySnx RPCVD epitaxy

Margetis, Joe; Mosleh, Aboozar; Ghetmiri, Seyed Amir; Al-Kabi, Sattar; Dou, Wei; Du, Wei; Bhargava, Nupur; Yu, Shui-Qing; Profijt, Harald; Kohen, David; Loo, Roger; Vohra, Anurag; Tolle, John (2017)

Fundamentals of low-resistive 2D-semiconductor metal contacts: an ab-initio NEGF study

Duflou, Rutger; Pourtois, Geoffrey; Houssa, Michel; Afzalian, Aryan (2023-05-31)