Recently added

Measurement-based analysis of dense multipath components in a large industrial warehouse

Hanssens, Brecht; Kshetri, Sunil Raut; Tanghe, Emmeric; Plets, David; Hoebeke, Jeroen; Karaagac, Abdulkadir; Haxhibeqiri, Jetmir; Gaillot, Davy P.; Liénard, Martine; Oestges, Claude; Martens, Luc; Joseph, Wout (2018)

Indoor ultra-wideband channel modeling and localization using multipath estimation algorithms

Hanssens, Brecht (2018-05)

Recent progress of imprinted polymer photonic waveguide devices and applications

Han, Xiu-You; Wu, Zhen-Lin; Yang, Si-Chang; Shen, Fang-Fang; Liang, Yu-Xin; Wang, Ling-Hua; Wang, Jin-Yan; Ren, Jun; Jia, Ling-Yun; Zhang, Hua; Bo, Shu-Hui; Morthier, Geert; Zhoa, MIngshan (2018-05)

Runtime precomputation of data-dependent parameters in embedded systems

Hammari, Elena; Kjeldsberg, Per Gunnar; Catthoor, Francky (2018)

Deadlock-free monitors

Hamin, Jafar; Jacobs, Bart (2018)

Minimizing EUV edge placement error by fast high resolution SEM

Halder, Sandip; Leray, Philippe (2018)

EUV lithography qualification: Comparison of alternative wafer inspection methodologies and sensitivities

Halder, Sandip; Leray, Philippe (2018)

Review-SEM image analysis with K-means algorithm

Halder, Sandip; Cerbu, Dorin; Saib, Mohamed; Leray, Philippe (2018)

Using machine learning algorithms on review sem images to understand stochastic behaviour of EUV based patterning for n7 and smaller nodes

Halder, Sandip; Cerbu, Dorin; Leray, Philippe (2018)

Tensor Based Approaches in Magnetic Resonance Spectroscopic Imaging and Multi-parametric MRI Data Analysis

Halandur Nagaraja, Bharath (2018-09)

Vertical-cavity silicon-integrated lasers by bonding and transfer printing

Haglund, E.P.; Kumari, Sulakshna; Goyvaerts, Jeroen; Gustavsson, J.S.; Baets, Roel; Roelkens, Gunther; Larsson, A. (2018)

CuNi alloy electrodeposition for microbumps using benzotriazole

Haesevoets, Karel; Radisic, Alex; Vereecken, Philippe (2018)

Interface and properties of nanocrystalline CVD diamond on A1GaN/GaN heterostructures

Haenen, Ken (2018)

Measurement and analysis of input-signal dependent flicker noise modulation in chopper stabilized instrumentation amplifier

Ha, Hyunsoo; Van Hoof, Chris; Van Helleputte, Nick (2018)

imec Publications: Recent submissions

Measurement-based analysis of dense multipath components in a large industrial warehouse

Indoor ultra-wideband channel modeling and localization using multipath estimation algorithms

Recent progress of imprinted polymer photonic waveguide devices and applications

Runtime precomputation of data-dependent parameters in embedded systems

Deadlock-free monitors

Minimizing EUV edge placement error by fast high resolution SEM

EUV lithography qualification: Comparison of alternative wafer inspection methodologies and sensitivities

Review-SEM image analysis with K-means algorithm

Using machine learning algorithms on review sem images to understand stochastic behaviour of EUV based patterning for n7 and smaller nodes

Tensor Based Approaches in Magnetic Resonance Spectroscopic Imaging and Multi-parametric MRI Data Analysis

Vertical-cavity silicon-integrated lasers by bonding and transfer printing

CuNi alloy electrodeposition for microbumps using benzotriazole

Interface and properties of nanocrystalline CVD diamond on A1GaN/GaN heterostructures

Measurement and analysis of input-signal dependent flicker noise modulation in chopper stabilized instrumentation amplifier

Off-limits: Abusing legacy x86 memory segmentation to Spy on enclaved execution

Plasmonic devices electrically driven by tunnel junctions

Impact of band to band tunneling in In0.53Ga0.47As tunnel diodes on the deep level transient spectra

Electrical properties of extended defects in strain relaxed GeSn

Defect evaluation in strain-relaxed Ge0.947Sn0.053 grown on (001) Si

Properties of defects in GeSn and III-V based heterostructures

imec Publications: Recent submissions

Measurement-based analysis of dense multipath components in a large industrial warehouse ﻿

Indoor ultra-wideband channel modeling and localization using multipath estimation algorithms ﻿

Recent progress of imprinted polymer photonic waveguide devices and applications ﻿

Runtime precomputation of data-dependent parameters in embedded systems ﻿

Deadlock-free monitors ﻿

Minimizing EUV edge placement error by fast high resolution SEM ﻿

EUV lithography qualification: Comparison of alternative wafer inspection methodologies and sensitivities ﻿

Review-SEM image analysis with K-means algorithm ﻿

Using machine learning algorithms on review sem images to understand stochastic behaviour of EUV based patterning for n7 and smaller nodes ﻿

Tensor Based Approaches in Magnetic Resonance Spectroscopic Imaging and Multi-parametric MRI Data Analysis ﻿

Vertical-cavity silicon-integrated lasers by bonding and transfer printing ﻿

CuNi alloy electrodeposition for microbumps using benzotriazole ﻿

Interface and properties of nanocrystalline CVD diamond on A1GaN/GaN heterostructures ﻿

Measurement and analysis of input-signal dependent flicker noise modulation in chopper stabilized instrumentation amplifier ﻿

Off-limits: Abusing legacy x86 memory segmentation to Spy on enclaved execution ﻿

Plasmonic devices electrically driven by tunnel junctions ﻿

Impact of band to band tunneling in In0.53Ga0.47As tunnel diodes on the deep level transient spectra ﻿

Electrical properties of extended defects in strain relaxed GeSn ﻿

Defect evaluation in strain-relaxed Ge0.947Sn0.053 grown on (001) Si ﻿

Properties of defects in GeSn and III-V based heterostructures ﻿

Measurement-based analysis of dense multipath components in a large industrial warehouse

Indoor ultra-wideband channel modeling and localization using multipath estimation algorithms

Recent progress of imprinted polymer photonic waveguide devices and applications

Runtime precomputation of data-dependent parameters in embedded systems

Deadlock-free monitors

Minimizing EUV edge placement error by fast high resolution SEM

EUV lithography qualification: Comparison of alternative wafer inspection methodologies and sensitivities

Review-SEM image analysis with K-means algorithm

Using machine learning algorithms on review sem images to understand stochastic behaviour of EUV based patterning for n7 and smaller nodes

Tensor Based Approaches in Magnetic Resonance Spectroscopic Imaging and Multi-parametric MRI Data Analysis

Vertical-cavity silicon-integrated lasers by bonding and transfer printing

CuNi alloy electrodeposition for microbumps using benzotriazole

Interface and properties of nanocrystalline CVD diamond on A1GaN/GaN heterostructures

Measurement and analysis of input-signal dependent flicker noise modulation in chopper stabilized instrumentation amplifier

Off-limits: Abusing legacy x86 memory segmentation to Spy on enclaved execution

Plasmonic devices electrically driven by tunnel junctions

Impact of band to band tunneling in In0.53Ga0.47As tunnel diodes on the deep level transient spectra

Electrical properties of extended defects in strain relaxed GeSn

Defect evaluation in strain-relaxed Ge0.947Sn0.053 grown on (001) Si

Properties of defects in GeSn and III-V based heterostructures