Publication:
Contribution of fast and slow states to negative bias temperature instabilities in Hf(x)Si(1-x)ON/TaN based pMOSFETs
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1840 since deposited on 2021-10-16
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Acq. date: 2026-10-09
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Statistics
Views
1840 since deposited on 2021-10-16
3last month
3last week
Acq. date: 2026-10-09
Citations