Contribution of fast and slow states to negative bias temperature instabilities in Hf(x)Si(1-x)ON/TaN based pMOSFETs

Publication:

2005

Journal article

Author(s)

;

;

;

;

;

Microelectronic Engineering

1837 since deposited on 2021-10-16

4last month

4last week

Acq. date: 2026-08-10