Authors

Cimino, Salvatore; Pantisano, Luigi; Aoulaiche, Marc; Degraeve, Robin; Kwak, Dong Hwa; Crupi, Felice; Groeseneken, Guido; Paccagnella, A.

Conference

43rd Annual IEEE International Reliability Physics Symposium Proceedings

Title

Hot carrier degradation on n-channel SiO2/HfSiO MOSFETs: Effects on the devices performance and lifetime

Publication type

Proceedings paper