Hot carrier degradation on n-channel SiO2/HfSiO MOSFETs: Effects on the devices performance and lifetime

Publication:

2005

Proceedings Paper

Author(s)

Cimino, Salvatore

;

Pantisano, Luigi

;

Aoulaiche, Marc

;

;

Kwak, Dong Hwa

;

Crupi, Felice

;

;

Paccagnella, A.

1997 since deposited on 2021-10-16

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Acq. date: 2026-08-06