Publication:

Performance improvement of tall triple gate devices with strained SiN layers

Date

2005-11

Journal article

Simple item page Full metadata Statistics

Author(s)

Collaert, Nadine

;

De Keersgieter, An

;

Kottantharayil, Anil

;

Rooyackers, Rita

;

;

Goodwin, Michael

;

Eyckens, Brenda

;

;

de Marneffe, Jean-Francois

;

De Meyer, Kristin

;

Absil, Philippe

;

;

Biesemans, Serge

Journal

IEEE Electron Device Letters

Metrics

1996 since deposited on 2021-10-16

Acq. date: 2026-01-08