Publication:
Defect analysis of strained silicon on thin strain-relaxed buffer layers for high mobility transistors
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1919 since deposited on 2021-10-16
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Acq. date: 2025-10-25
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1919 since deposited on 2021-10-16
419item.page.metrics.field.last-week
Acq. date: 2025-10-25
Citations