Publication:

Defect analysis of strained silicon on thin strain-relaxed buffer layers for high mobility transistors

Date

2005

Journal article

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Author(s)

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Delhougne, Romain

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Gaubas, Eugenijus

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Roussel, Philippe

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Verheyen, Peter

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Vandervorst, Wilfried

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De Meyer, Kristin

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Journal

Journal of Physics: Condensed Matter

Statistics

1923 since deposited on 2021-10-16

Acq. date: 2026-02-25