A new method to calculate leakage current and its applications for sub-45nm MOSFETs

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Author(s)

Lujan, Guilherme

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Pourghaderi, Mohammad Ali

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Veloso, Anabela

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Kubicek, Stefan

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De Gendt, Stefan

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De Meyer, Kristin

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1936 since deposited on 2021-10-16

Acq. date: 2025-10-23