Publication:
Saturation threshold voltage degradation in deep-submicrometer fully depleted SOI nMOSFETs operating in cryogenic environments
Date
Loading...
Journal
Abstract
Description
Statistics
Views
1943 since deposited on 2021-10-16
1last month
1last week
Acq. date: 2026-02-25
Citations
Statistics
Views
1943 since deposited on 2021-10-16
1last month
1last week
Acq. date: 2026-02-25
Citations