Authors

Rafi, J.M.; Simoen, Eddy; Mercha, Abdelkarim; Canmpabadal, F.; Claeys, Cor

Issue

5

Journal

Solid-State Electronics

Volume

49

Title

Impact of hot-carrier stress on gate-induced floating body effects and drain current transients of thin-gate-oxide partially depleted SOI NMOSFETs

Publication type

Journal article