Publication:

Analysis of depth-inhomogeneous strains in deep sub-micron silicon devices by TEM/CBED

Date

Loading...
Thumbnail Image

Abstract

Description

Metrics

Views

1910 since deposited on 2021-10-16
Acq. date: 2025-10-23

Citations

Metrics

Views

1910 since deposited on 2021-10-16
Acq. date: 2025-10-23

Citations