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Interface characterization of nanoscale laminate structures on dense dielectric substrates by x-ray reflectivity
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Authors
Travaly, Youssef
;
Schuhmacher, Jorg
;
Martin Hoyas, Ana
;
Van Hove, Marleen
;
Maex, Karen
;
Abell, Thomas
;
Sutcliffe, Victor
;
Jonas, A.M.
Issue
16
Journal
Virtual Journal of Nanoscale Science and Technology
Volume
11
Title
Interface characterization of nanoscale laminate structures on dense dielectric substrates by x-ray reflectivity
Publication type
Journal article
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