Quantifying self-heating effects with scaling in globally strained Si MOSFETS

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Authors

Agaiby, R.; Yang, Y.; Olsen, S.H.; O'Neill, A.G.; Eneman, Geert; Verheyen, Peter; Loo, Roger; Claeys, Cor

Issue

11_12

Journal

Solid-State Electronics

Volume

51

Title

Quantifying self-heating effects with scaling in globally strained Si MOSFETS

Publication type

Journal article

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