Authors

Degraeve, Robin; De Blauwe, Jan; Ogier, Jean-Luc; Roussel, Philippe; Groeseneken, Guido; Maes, Herman

Conference

International Electron Devices Meeting. Technical Digest - IEDM

Title

A new polarity dependence of the reduced trap generation during high-field degradation of nitrided oxides

Publication type

Proceedings paper

Embargo date

9999-12-31