Publication:
Reliability of ultra-thin gate oxides below 3 nm in the direct tunneling regime
Date
Loading...
Files
Journal
Abstract
Description
Statistics
Views
1897 since deposited on 2021-09-29
Acq. date: 2026-02-24
Citations
Statistics
Views
1897 since deposited on 2021-09-29
Acq. date: 2026-02-24
Citations