Publication:
Dose rate dependence of the back gate degradation in thin gate oxide PD-SOI MOSFETs by 2-MeV electron irradiation
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1971 since deposited on 2021-10-16
2last month
Acq. date: 2026-05-31
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Statistics
Views
1971 since deposited on 2021-10-16
2last month
Acq. date: 2026-05-31
Citations