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Determining weak Fermi-level pinning in MOS devices by coductance and capacitance analysis and application to GaAs MOS devices
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Authors
Martens, Koen
;
Wang, Wenfei
;
dimoulas, A.
;
Borghs, Gustaaf
;
Meuris, Marc
;
Groeseneken, Guido
;
Maes, Herman
Issue
8
Journal
Solid-State Electronics
Volume
51
Title
Determining weak Fermi-level pinning in MOS devices by coductance and capacitance analysis and application to GaAs MOS devices
Publication type
Journal article
Embargo date
9999-12-31
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