Publication:
Prediction of the influence of induced stresses in silicon on CMOS Performance in a Cu-through-via interconnect technology
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1970 since deposited on 2021-10-16
9last month
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Acq. date: 2026-08-06
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Statistics
Views
1970 since deposited on 2021-10-16
9last month
4last week
Acq. date: 2026-08-06
Citations