Authors

Severi, Simone; Pawlak, Bartek; Duffy, Ray; Augendre, Emmanuel; Henson, Kirklen; Lindsay, Richard; De Meyer, Kristin

Issue

3

Journal

IEEE Electron Device Letters

Volume

28

Title

Arsenic junction thermal stability and high-dose boron-pocket activation during SPER in nMOS transistors

Publication type

Journal article