Authors

Simoen, Eddy; Claeys, Cor; Chung, T.M.; Flandre, D.; Raskin, J.P.

Issue

10

Journal

IEEE Electron Device Letters

Volume

28

Title

On the origin of the excess low-frequency noise in graded-channel silicon-on-insulator nMOSFETs

Publication type

Journal article

Embargo date

9999-12-31