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Surface properties restoration and passivation of high porosity ultra low-k dielectric (k~2.3) after direct-CMP
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Authors
Sinapi, Fabrice
;
Heylen, Nancy
;
Travaly, Youssef
;
Vereecke, Guy
;
Baklanov, Mikhaïl
;
Kesters, Els
;
Van Hoeymissen, Jan
;
Hernandez, Jose Luis
;
Beyer, Gerald
;
Fisher, P.
Issue
11
Journal
Microelectronic Engineering
Volume
84
Title
Surface properties restoration and passivation of high porosity ultra low-k dielectric (k~2.3) after direct-CMP
Publication type
Journal article
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