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Surface properties restoration and passivation of high porosity ultra low-k dielectric (k~2.3) after direct-CMP
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Surface properties restoration and passivation of high porosity ultra low-k dielectric (k~2.3) after direct-CMP
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Date
2007
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Sinapi, Fabrice
;
Heylen, Nancy
;
Travaly, Youssef
;
Vereecke, Guy
;
Baklanov, Mikhaïl
;
Kesters, Els
;
Van Hoeymissen, Jan
;
Hernandez, Jose Luis
;
Beyer, Gerald
;
Fisher, P.
Journal
Microelectronic Engineering
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1939
since deposited on 2021-10-16
Acq. date: 2025-12-12
Citations
Metrics
Views
1939
since deposited on 2021-10-16
Acq. date: 2025-12-12
Citations