Maintenance work will take place today between 6:00-6:30 PM. The service may be unavailable during this time. We apologize for any inconvenience.
 
Publication:

High performance & CMOS integration friendly dual metal gate MOSFETs using TaN/Ru or TaN/W/Ru stacking multi-layers on HfLaO gate dielectric

Date

Loading...
Thumbnail Image

Abstract

Description

Statistics

Views

1930 since deposited on 2021-10-16
Acq. date: 2026-07-27

Citations

Statistics

Views

1930 since deposited on 2021-10-16
Acq. date: 2026-07-27

Citations