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Defects generation in SiO2/HfO2 studied with variable Tcharge-Tdischarge charge pumping (VT2CP)
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1910 since deposited on 2021-10-16
Acq. date: 2026-04-07
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Views
1910 since deposited on 2021-10-16
Acq. date: 2026-04-07
Citations