Publication:
Advanced electrical characterization toward (sub) 1nm EOT HfSiON – hole trapping in PFET and L-dependent effects
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1908 since deposited on 2021-10-16
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Acq. date: 2026-02-28
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Statistics
Views
1908 since deposited on 2021-10-16
1last month
1last week
Acq. date: 2026-02-28
Citations