Publication:
Impact of millisecond laser anneal on the thermal stress-induced defect creation in Si1-xGex source/drain junctions
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1921 since deposited on 2021-10-17
2last month
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Acq. date: 2026-10-12
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Statistics
Views
1921 since deposited on 2021-10-17
2last month
1last week
Acq. date: 2026-10-12
Citations