Toggle navigation
My submissions
Login
Toggle navigation
View item
imec Publications Repository
imec Publications
Conference contributions
View item
imec Publications Repository
imec Publications
Conference contributions
View item
JavaScript is disabled for your browser. Some features of this site may not work without it.
The role of interface states in the low temperature mobility of hafnium-oxide gated Ge-pMOSFETs and the effect of a hydrogen anneal
View/
open
17646.pdf (97.14Kb)
Metadata
Show full item record
Authors
Beer, C.S.
;
Whall, T.E.
;
Parker, E.H.C.
;
Leadley, D.R.
;
De Jaeger, Brice
;
Nicholas, Gareth
;
Zimmerman, Paul
;
Meuris, Marc
Conference
9th International Conference on Ultimate Integration of Silicon - ULIS
Title
The role of interface states in the low temperature mobility of hafnium-oxide gated Ge-pMOSFETs and the effect of a hydrogen anneal
Publication type
Proceedings paper
Embargo date
9999-12-31
Collections
Conference contributions
Search imec Publications Repository
This collection
Browse
All of imec Publications Repository
Collections
Publication date
Authors
Titles
Subjects
imec author
Availability
Publication type
This collection
Publication date
Authors
Titles
Subjects
imec author
Availability
Publication type
My account
login