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The role of interface states in the low temperature mobility of hafnium-oxide gated Ge-pMOSFETs and the effect of a hydrogen anneal
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1904 since deposited on 2021-10-17
Acq. date: 2025-12-08
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Views
1904 since deposited on 2021-10-17
Acq. date: 2025-12-08
Citations