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SLIM-Cut: a kerf-loss-free method for wafering 50-μm-thick crystalline Si wafers based on stress-induced lift-off
Publication:
SLIM-Cut: a kerf-loss-free method for wafering 50-μm-thick crystalline Si wafers based on stress-induced lift-off
Date
2008
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Dross, Frederic
;
Milhe, Aurelien
;
Robbelein, Jo
;
Gordon, Ivan
;
Bouchard, Pierre-Olivier
;
Beaucarne, Guy
;
Poortmans, Jef
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1892
since deposited on 2021-10-17
464
item.page.metrics.field.last-week
Acq. date: 2025-10-25
Citations
Metrics
Views
1892
since deposited on 2021-10-17
464
item.page.metrics.field.last-week
Acq. date: 2025-10-25
Citations