Publication:
Strain study in transistors with SiC and SiGe source and drain by STEM nano beam diffraction
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1866 since deposited on 2021-10-17
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Acq. date: 2025-10-24
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Views
1866 since deposited on 2021-10-17
411item.page.metrics.field.last-week
Acq. date: 2025-10-24
Citations