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Mobility degradation influence on the SOI MOSFET channel length extraction at 77 K
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Authors
Nicolett, A. S.
;
Martino, Joao Antonio
;
Simoen, Eddy
;
Claeys, Cor
Journal
Journal de Physique IV. Colloque 3
Volume
6
Title
Mobility degradation influence on the SOI MOSFET channel length extraction at 77 K
Publication type
Journal article
Embargo date
9999-12-31
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