Authors

Guo, Wei; Cretu, B.; Routoure, J.-M.; Carin, R.; Simoen, Eddy; Mercha, Abdelkarim; Collaert, Nadine; Put, Sofie; Claeys, Cor

ISSN

0038-1101

Issue

12

Journal

Solid-State Electronics

Volume

52

Title

Impact of strain and source/drain engineering on the low-frequency noise behaviour in n-channel Tri-Gate FinFETs

Publication type

Journal article