Publication:

Carrier lifetime analysis in thin gate oxide FD-SOI n-MOSFETs by gate-induced drain current tranients

Date

Loading...
Thumbnail Image

Journal

Abstract

Description

Metrics

Views

1952 since deposited on 2021-10-17
Acq. date: 2025-10-23

Citations

Metrics

Views

1952 since deposited on 2021-10-17
Acq. date: 2025-10-23

Citations