Authors

Hayama, K.; Takakura, K.; Ohyama, H.; Rafi, J.M.; Mercha, Abdelkarim; Simoen, Eddy; Claeys, Cor

ISSN

0957-4522

Issue

2

Journal

Journal of Materials Science: Materials in Electronics

Volume

19

Title

Carrier lifetime analysis in thin gate oxide FD-SOI n-MOSFETs by gate-induced drain current tranients

Publication type

Journal article

Embargo date

9999-12-31