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Effect of the built-in stress level of AlN layers on their dielectric and piezoelectric properties with perspectives on energy harvesting
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Effect of the built-in stress level of AlN layers on their dielectric and piezoelectric properties with perspectives on energy harvesting
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Date
2008
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Karakaya, Koray
;
Renaud, Michael
;
Goedbloed, Martijn
;
van Schaijk, Rob
Journal
Journal of Micromechanics and Microengineering
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1899
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Acq. date: 2025-12-10
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Metrics
Views
1899
since deposited on 2021-10-17
2
last month
1
last week
Acq. date: 2025-12-10
Citations